Your daily dose of photovoltaic technology developments and solar news

• Popular Technical Papers

  • Overview of automation in the photovoltaic industry
  • Understanding moisture ingress and packaging requirements for photovoltaic modules
  • Evaluation of encapsulant materials for PV applications
  • Inline processing of crystalline silicon solar cells: the holy grail for large-scale manufacturing?
  • PV sector outlook: an analyst’s perspective

• Featured Technical Papers

  • Transparent conducting oxide deposition techniques for thin-film photovoltaics
  • Comprehensive and advanced quality assurance measures for optimal yields from PV power plants
  • Surface passivation of silicon solar cells using industrially relevant Al2O3 deposition techniques
  • Influence of a-Si:H deposition temperature on thermal stability of a-Si:H/SiNx:H stacks
  • Integrated loops: a prerequisite for sustainable and environmentally-friendly polysilicon production

An improved understanding of multicrystalline wafer quality can explain variations in cell performance across multicrystalline silicon blocks. Infrared scanning can detect precipitates in a silicon block, while photoluminescence combined with defect etching can reveal needle-like precipitates along the grain boundaries. Such precipitates typically lead to reduced shunt resistance. Crystallographic defects that lower the current collection and the final cell efficiency can also be identified. Understanding the influence of these defects is important for the development of a crystallization technology that results in a substantially better cell efficiency. The use of the improved material quality in an innovative cell and module technology have led to the world record module efficiency of 17%. This paper will illustrate one example of how an improved understanding of multicrystalline wafer quality can explain the variations in cell performance.

Paper costs $15.00. It's FREE when you purchase a subscription.